ARCNL researchers report on helical soft-X-ray beams
Controlling the properties of light is of great importance for many areas of physics, including imaging and nanolithography. But for short wavelengths, such as soft-X-ray radiation, such control over especially the phase of light has remained elusive.
02/27/2020 | 6:58 PM
Loetgering et al used this new method to generate so-called helical beams of soft-X-ray radiation, in which the intensity distribution of light rotates around its axis upon propagation. They employed a special imaging approach called ptychography to characterize the intensity and phase properties of these helical beams in great detail. Furthermore, they demonstrated the potential of these special beams for high-resolution microscopy, by using them to image a cross-section of an integrated circuit at 30 nanometer spatial resolution.
Figure: 3D-reconstruction of the intensity of a helical soft-X-ray beam as it propagates, as well as a series of cross-sectional images at different propagation distances.